CFast Cards™

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CFast™ cards combine the CompactFlash™ (CF) card form factor and the Serial ATA (SATA) interface into a single product. CFast™ cards can replace both HDDs and CompactFlash™ cards in applications requiring small form factors, high endurance and the ability to withstand shock, vibration, extreme temperatures (-40°C to +85°C), and rough environmental conditions. Swissbit’s CFast™ cards provide rugged and easy replaceable storage for embedded and industrial systems. The Swissbit CFast™ card portfolio covers the range from high end SLC based F-600 to the cost/performance optimized F-50. With an equal feature set as the 2.5“ X-60 SSD, the F-60 MLC product and F-66 pSLC card are perfect devices for high performance and endurance and lowest total cost of ownership.

Series Name

F-66

F-600

F-60

F-50

F-56

F-240

Interface

Data Transfer Mode

CFast™ 2.0 – SATA III – 6 Gbit/s

ATA8

CFast™ 1.0 – SATA II – 3 Gbit/s

ATA7

Connector

CFast™ Type I

Outline Dimensions

36.4 x 42.8 x 3.6 mm

Flash Type

pSLC everbit

SLC

MLC durabit

MLC

pSLC everbit

SLC

Density Range

16 GB – 120 GB

8 GB – 64 GB

8 GB – 240 GB

8 GB – 256 GB

4 GB – 128 GB

2 GB – 64 GB

Data Retention

 

10 years @ life begin

1 year @ life end

Endurance
(Enterprise Workload)

up to 13.2 TBW per GB drivce capacity

up to 7.6 TBW per GB drivce capacity

up to 0.3 TBW per GB drive capacity

up to 0.05 TBW per GB drive capacity

up to 0.3 TBW per GB drive capacity

100,000 P/E cycles
(Flash cell level)

Operating Temperature

Commercial: 0°C to +70°C

Industrial: -40°C to +85°C

Storage Temperature

-40°C to +100°C

Performance

Burst Rate (MB/s)

Sequential Read (MB/s)

Sequential Write (MB/s)

Random 4KB Read (IOPS)

Random 4KB Write (IOPS)

 

up to 600

up to 520

up to 415

up to 80,000

up to 75,000

 

up to 600

up to 520

up to 245

up to 76,000

up to 54,000

 

up to 600

up to 520

up to 180

up to 72,000

up to 43,000

 

up to 600

up to 500

up to 330

up to 53,000

up to 74,000

 

up to 600

up to 510

up to 415

up to 32,000

up to 66,000

 

up to 300

up to 120

up to 120

up to 3,200

up to 75

MTBF

≥ 2,000,000 hours

≥ 2,500,000 hours

Shock

1,500 g, 0.5 ms duration, half-sine wave

500 g, 0.5 ms duration, half-sine wave

1,500 g, 0.5 ms duration, half-sine wave

Vibration

20 G

Humidity

85 % RH 85°C, 1,000 hrs

Voltage

3.3 V ± 5 %

Power Consumption

typ 380 mA

max 560 mA

Idle 108 mA

DEVSLP 35 mA

typ 450 mA

max 715 mA

Idle 105 mA

DEVSLP 35 mA

typ 400 mA

max 495 mA

Idle 110 mA

DEVSLP 35 mA

typ 290 mA

max 420 mA

Idle 75 mA

DEVSLP 35 mA

typ 310 mA

max 645 mA

Idle 75 mA

DEVSLP 5 mA

typ 140 mA

max 250 mA

Idle 55 mA

PHYSLP < 20 mA

Features & Tools

pSLC Flash with
20k PE Cycles

Proven Power Fail Safety

NCQ, TRIM

Advanced Wear Leveling & Bad Block management

In-field firmware update

SBLTM Tool & SDK for S.M.A.R.T. based Life Time Monitoring

Proven Power Fail Safety

NCQ, TRIM

Advanced Wear Leveling & Bad Block management

In-field firmware update

SBLTM Tool & SDK for S.M.A.R.T. based Life Time Monitoring

Proven Power Fail Safety

NCQ, TRIM

Advanced Wear Leveling & Bad Block management

In-field firmware update

SBLTM Tool & SDK for S.M.A.R.T. based Life Time Monitoring

Proven Power Fail Safety

NCQ, TRIM

Advanced Wear Leveling & Bad Block management

In-field firmware update

SBLTM Tool & SDK for S.M.A.R.T. based Life Time Monitoring

Proven Power Fail Safety

pSLC Flash with
20k PE Cycles

NCQ, TRIM

Advanced Wear Leveling & Bad Block management

In-field firmware update

SBLTM Tool & SDK for S.M.A.R.T. based Life Time Monitoring

Proven Power Fail Safety

Sophisticated Wear Leveling & Bad Block management

Read Disturb Management

TRIM

Low Power Consumption

Security & SBZoneProtection features available

SBLTM Tool & SDK for S.M.A.R.T. based Life Time Monitoring

Evaluation kit with 2.5” SATA adapter board available

Part Number

SFCAxxxxHvAAxss-t-dd-rrr-ccc

SFCAxxxxHvADxss-t-dd-rrr-ccc

SFCAxxxxHvBVxss-t-dd-rrr-ccc

 

Product Features

Data Care Managment

Various effects like data retention, read disturb limits or temperature can impact data reliability. The latest generation of Swissbit products use special methods to maintain and refresh the data for higher data integrity.

ESD and EMI safe

The product designs are in line with the latest regulations for electrostatic discharge and electromagnetic interference. Swissbit strives to exceed these limits with our own in-house technology and production capabilities, for example with System-in-Package (SiP) competence.

Life time monitoring (LTM)

The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows predicting imminent failure avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor specific commands to retrieve the Flash product information.

Longevity

The longevity product lines use special components with a long-term supply commitment of up to 10 years. These products offer lowest TCO in demanding applications with high requalification cost.

Power fail protection

Intelligent Power Fail Protection & Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.

Read only optimized

In many industrial applications the data is written to the NAND Flash once and is only read afterwards. For such cases the firmware can be optimized in order to guarantee highest possible data retention and less read disturb.

Shock and vibration

Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.

Temperature sensor

The sensor allows the host hardware or software to monitor the memory device temperature to improve data reliability in the target application environment.

Trim support

The TRIM command allows the operating system to inform the SSD which blocks of data are no longer considered in use and can be wiped out internally which increases system performance in following write accesses. With TRIM Support data scrap can be deleted in advance which otherwise would slow down future write operations to the involved blocks.

WAF reduction

The WAF (write amplification factor) for MLC based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.

Wear leveling

Sophisticated Wear Leveling & Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.

Wide temperature support

Swissbit‘s embedded memory & storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).

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